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GTL 4060 Probe Station
 

The GTL 4060 is our largest probe station, and is useful for probing large PCBs and assemblies. It is currently popular for measuring high speed digital backplanes with line cards, and long, lossy differential transmission lines. Like all GigaTest probe stations, the 4060 is machined with very tight tolerances, and includes precise positioning control, to allow accurate probing of fine-pitch structures. It can be configured with a High Power Microscope and special microscope bridge for probing micron-level structures on wafer and bare die. With this configuration, the 4060 is very useful for failure analysis probing where operational systems like motherboards have open-package devices which need probing.

 
GTL 4060
Specifications:
Chuck Size: 18" x 24"
Microscope: Leica GZ-6 w/ Rigid Bridge or Articulated Arm Mitutoyo FS-70 High Power Microscope w/ Rigid Bridge
XYZ Stage Control (range/resolution)
X: 3.0 inches / 0.25 mil (5um)
  Y: 2.0 inches / 0.25 mil (5um)
  Z: 2.0 inches / 0.25 mil (5um)
GigaTest Micropositioners: 2
Positioner Control (range/resolution)
  X: 1.0 inch / 40 TPI micrometers
  Y: 1.0 inch / 40 TPI micrometers
  Z: 1.0 inch / 40 TPI micrometers
  Theta: +/- 10 degrees (planarity adjustment)
X, Y, Z control of Chuck
PCB Fixturing Kit
Applications:
Backplanes
Flat-panel displays
System Measurements
Failure Analysis
DUT Boards
Test Heads
Interconnect Components
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